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ASTM F637-1985(2001)  标准规范格式,物理性能和试验方法19和35mm可测试胶带载体的周边带载,保税半导体器件

标准编号:ASTM F637-1985(2001)
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中文标准名称:标准规范格式,物理性能和试验方法19和35mm可测试胶带载体的周边带载,保税半导体器件
英文标准名称:Standard Specification for Format, Physical Properties, and Test Methods for 19 and 35 mm Testable Tape Carrier for Perimeter Tape Carrier-Bonded Semiconductor Devices
标准状态:Withdrawn
复审确认日期:2001
代替标准号:ASTM F637-85(1994)e1
语言:英文版,中文版
发布日期:1985
标准类别:美国材料与试验协会ASTM
中国标准文献分类法(中标分类CCS):
中国标准文献分类法(中标分类CCS):货物的包装和调运 >> 卷轴、线轴
标准页数:7P.;A4
标准简介:

1.1 This specification covers standard formats for testable semiconductor lead carrier tape suitable for hybrid applications.

1.2 This standard specifies tape width, configuration, and location of guide perforations ("sprocket holes"), location of lead pattern frames on tape, lead pattern window size, and placement of outer lead bond and electrical test pad areas in the lead pattern.

1.3 The values stated in inch-pound units are to be regarded as the standard. The values given in parentheses are for information only.

1.4 The following hazard caveat pertains only to the test method portion, Section 7 of this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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文件大小:238 KB
添加时间:2013/10/17
 
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